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Thickness-dependent ferromagnetic metal to paramagnetic insulator transition in La$_{0.6}$Sr$_{0.4}$MnO$_3$ thin films studied by x-ray magnetic circular dichroism

机译:厚度依赖的铁磁金属到顺磁绝缘体   通过X射线研究La $ _ {0.6} $ sr $ _ {0.4} $ mnO $ _3 $薄膜的过渡   磁性圆二色性

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摘要

Metallic transition-metal oxides undergo a metal-to-insulator transition(MIT) as the film thickness decreases across a ritical thickness of severalmonolayers (MLs), but its driving mechanism remains controversial. We havestudied the thickness-dependent MIT of the ferromagnetic metalLa$_{0.6}$Sr$_{0.4}$MnO$_3$ by x-ray absorption spectroscopy and x-ray magneticcircular dichroism. As the film thickness was decreased across the criticalthickness of the MIT (6-8 ML), a gradual decrease of the ferromagnetic signalsand a concomitant increase of paramagnetic signals were observed, while the Mnvalence abruptly decreased towards Mn$^{3+}$. These observations suggest thatthe ferromagnetic phase gradually and most likely inhomogeneously turns intothe paramagnetic phase and both phases abruptly become insulating at thecritical thickness.
机译:随着膜厚度跨几个单层(MLs)的临界厚度减小,金属过渡金属氧化物会经历金属到绝缘体的转变(MIT),但其驱动机理仍存在争议。我们通过X射线吸收光谱法和X射线磁圆二向色性研究了铁磁性金属La $ {{0.6} $ Sr $ _ {0.4} $ MnO $ _3 $的厚度依赖性MIT。随着膜厚度在MIT的临界厚度(6-8 ML)上减小,铁磁信号逐渐减小,顺磁信号随之增加,而Mn价朝Mn $ ^ {3 +} $急剧减小。这些观察结果表明,铁磁相逐渐地并且很可能不均匀地变成顺磁相,并且两个相在临界厚度处突然绝缘。

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